Breakthroughs in materials science research depend on fast, reproducible, high-resolution information that allows scientists to optimize materials performance. To advance their understanding of complex materials and in order to develop innovative new materials, scientists must be able to correlate form and function; resolve in space, time, and frequency; and investigate with robust, precise instrumentation.
FEI’s latest, cutting edge, transmission electron microscope, Themis Z, combines proven optics, outstanding EDS performance, and new imaging capabilities with enhanced automation software to put the ultimate imaging and spectroscopic performance in the hands of all materials scientists. Combining unprecedented atomic resolution performance in both high-resolution TEM and STEM imaging across the entire acceleration voltage range of 60 to 300 kilovolts, the Themis Z platform is the most flexible tool for investigating the widest range of materials science applications.
In this webcast:
Eric studied Physics in Antwerp, Belgium, in the lab of Prof. Amelinckx (now EMAT), and both his Masters and Ph.D. were in the field of Electron Microscopy. After several academic positions in Belgium, Congo, Germany, and France, Eric joined Philips Electron Optics, where he held a variety of positions in applications and product management. Eric was a member of the team that defined the requirements for a dedicated TEM column for CS correction. These efforts led to the launch of the Titan product line. Eric is currently based in Portland, Oregon, as the high-end TEM Product Marketing Engineer for the Materials Science Business Unit.