Outstanding productivity and repeatability for materials characterization at the sub-nanometer level

On-demand Webcast | Recorded: September 28th, 2017

Materials scientists and engineers depend on fast, reliable high resolution information that allows them to optimize materials performance and develop innovative new materials. This requires advanced imaging and analytical instrumentation that enables them to gain true understanding of material behavior and function. The Thermo Scientific™ Talos™ F200i S/TEM – our newest 20-200 kV high-performance, compact scanning transmission electron microscope (S/TEM)  – is uniquely designed for performance and productivity across a wide range of Materials Science samples and applications.

The great flexibility and configurability of the Talos F200i S/TEM column not only enable a wide range of applications – ranging from high-resolution 2D and 3D characterization to in situ dynamic observations and diffraction applications – but also makes high-performance imaging and analysis accessible to a wider range of laboratories. Designed for multi-user and multi-discipline environments and equipped with the familiar Thermo Scientific™ Velox™ user interface, the Talos F200i S/TEM is also ideal for novice users. All TEM daily tunings have been automated to provide the best and most reproducible setup. This automation eases the learning curve for novice operators, reduces tensions in a multi-user environment, and allows users to focus on science and results rather than on the operation of the microscope. In addition, the system's smaller footprint and more accessible enclosure are designed to facilitate service and reduce infrastructure and support requirements.

In this webcast, you will learn how to:

  • Perform the widest range of materials science research, including high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications on one flexible tool.
  • Enhance the productivity of your research, especially in multi-user, multi-material environments.
  • Achieve the most repeatable data with optimum imaging conditions for users of all experience levels, allowing more focus on research instead of the tool.

Presenter: Yuri Rikers

Ir. Yuri G.M. Rikers studied Applied Physics at the Eindhoven University of Technology. He started working at Thermo Fisher Scientific in 2002 as a Service & Applications specialist TEM in the Technical Support Group. Since 2007, he has been working in the Thermo Fisher Scientific NanoPort in Eindhoven as Sr. Applications Specialist TEM, mainly supporting the Tecnai, Titan and Talos product series for the Materials Science Business Unit. In late 2015, Yuri started working as a Product Marketing Manager for the TEM division of the Materials Science Business Unit.

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