Best-in-class sample prep and 3D characterization for the widest range of samples

On-demand webcast | Recorded: October 5th, 2017
 

Scientists and engineers constantly face new challenges that require highly localized characterization of increasingly complex samples with ever smaller features. The Thermo Scientific™ Scios™ 2 DualBeam™ System delivers best-in-class performance in sample preparation, subsurface and 3D characterization for the widest variety of samples.

The latest technological innovations of the Scios 2 DualBeam System, in combination with the easiest-to-use, most comprehensive Thermo Scientific AutoTEM™ 4 Software (optional) and Thermo Fisher Scientific’s application expertise, allow for fast and easy preparation of site-specific HR-S/TEM samples for a wide range of materials.

In this webinar, you will learn how to:

  • Quickly and easily prepare high-quality, site-specific, TEM samples using the Sidewinder HT ion column and AutoTEM 4 software (optional).
  • Achieve ultra-high resolution imaging using the Thermo Scientific NICol™ Electron Column on the widest range of samples, including magnetic and non-conductive materials.
  • Collect the most complete sample information with sharp, refined, and charge-free contrast obtained from a variety of integrated in-column and below-the-lens detectors.
 
Presenter: Daniel Phifer
Daniel Phifer is Senior Technical Sales and Business Development Engineer at Thermo Fisher Scientific, and supports ESEM, SEM and DualBeam applications for material science. He currently provides technical support on SEM, ESEM and DualBeam configurations and techniques. He has worked at Thermo Fisher Scientific since 1998 in several positions, gaining insight on materials including metals, minerals, semiconductor devices, forensics, polymers, and composites.  Daniel has a M.S. from the University of Tennessee and a B.A. from Auburn University.
 

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